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SN74BCT8373ADW spec: IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES
Path:OKDatasheet > Halbleiter Datenblatt > TI Datenblatt > SN74BCT8373ADW
SN74BCT8373ADW spec: IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES
Hersteller : TI
Verpacken : DW
Pins : 24
Temperatur : Min 0 °C | Max 70 °C
Größe : 323 KB
Application : IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES