Ähnliche SNJ54ABTH18502AHV

  • SNJ5400J
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES
  • SNJ5400W
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES
  • SNJ5400WA
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES
  • SNJ5401J
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
  • SNJ5401W
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
  • SNJ5402J
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES
  • SNJ5402J
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES
  • SNJ5402W
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SNJ54ABTH18502AHV Datenblatt und Spezifikationen

Hersteller : TI 

Verpacken : HV 

Pins : 68 

Temperatur : Min -55 °C | Max 125 °C

Größe : 603 KB

Application : SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS 

SNJ54ABTH18502AHV PDF-Download

SNJ54ABTH18502AHV PDF